5. Developments and challenges for testing

Over the last two decades, the implementation of the basic techniques and concepts presented above has come up against a number of constraints, mainly due to the continuing reduction in transistor sizes, but also to the emergence of new materials and new design practices. Maintaining a high level of reliability in the circuits we produce now requires us to adapt our test techniques for integration in more numerous, more varied and more demanding applications. The most significant problems encountered and some of the solutions found are briefly described below. For further information, please refer to the articles referenced in the bibliography section.