3. Notion of testability – Increasing testability
3.1 Key concepts
Testability can be broadly defined as the ability of a circuit or system to be tested. This aptitude depends on two complementary notions that are fundamental to testing:
the controllability of each internal electrical node, i.e. the degree of ease with which each node can be forced to each logic level, by positioning suitable levels on the primary inputs of the circuit or system only;
the observability of each internal electrical node, i.e. the degree of ease with which the logic level of each node can be determined simply by reading the primary outputs of the circuit or system.
The Ultimate Scientific and Technical Reference
This article is included in
Electronics
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Notion of testability – Increasing testability
From functional validation to test program
Bibliography
Paragraphs 1 to 4
Conferences
Many journals, symposia and conferences in the field of circuit design have sessions devoted to testing and may be of interest to supplement the information given in this article.
International test conference (ITC) (United States)
VLSI test symposium (VTS) (United States)
European test symposium (ETS) (Europe)
Design automation...
Standards and norms
IEEE 1149 standard, also known as the Boundary Scan standard, for testing board-based systems, https://standards.ieee.org/
ISO 26262 standard for vehicle functional safety,
RTCA DO 254 standard for functional safety in aeronautics,
Directory
Foundries: integrated circuit manufacturers (non-exhaustive list)
TSMC
Samsung Electronics
Global Foundries
The Ultimate Scientific and Technical Reference
