5. Conclusion

The field of local probe microscopy is expanding rapidly, and more and more research teams around the world are working in this field. Near-field microscopy still poses a number of theoretical and experimental difficulties, particularly when it comes to interpreting results or manufacturing ever finer probes. The next technological revolution cannot take place without a perfect understanding of the physical phenomena, both electromagnetic and mechanical, that take place at the atomic scale. However, it would be simplistic to consider the performance of this technique solely in terms of resolution. Unlike AFM or TEM (Transmission Electron Microscope), where the resolutions achieved can be quasi-atomic, its richness and power lie in its ability to provide access to information other than simply object topography or atomic arrangement, and to measure the intrinsic electromagnetic characteristics...