Presentation
Surface Enhanced Ellipsomteric Contrast (SEEC) microscopy : optical microscopy as a means of nanoscale characterization
Article REF: NM7500 V1
Presentation
Surface Enhanced Ellipsomteric Contrast (SEEC) microscopy : optical microscopy as a means of nanoscale characterization

Authors : Nicolas MEDARD, Marie-Pierre VALIGNAT

Publication date: October 10, 2011 | Lire en français

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1. Presentation

Nanosciences and nanotechnologies are a highly competitive, fast-growing strategic research sector, with considerable economic potential in many fields: IT, telecommunications, medicine, biology, materials, chemistry, energy and the environment. The associated markets are estimated at between $1,000 and $3,500 billion/year, 46% of which will be dedicated to equipment and characterization. Indeed, it is in this latter sector that expectations are highest, as it determines current and future development capacities. Without a new impetus in the instrumental field, the nanotechnology sector risks experiencing severe growth limitations.

At present, the nanometric characterization techniques on the market are mainly mechanical or electronic. Among these techniques, atomic force microscopy (AFM), scanning electron microscopy (SEM) and transmission electron microscopy (TEM)...

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