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Article | REF: NM7500 V1

Surface Enhanced Ellipsomteric Contrast (SEEC) microscopy : optical microscopy as a means of nanoscale characterization

Authors: Nicolas MEDARD, Marie-Pierre VALIGNAT

Publication date: October 10, 2011 | Lire en français

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    4. SEEC microscopy

    4.1 Principle

    In the early 2000s, a study conducted by Ausserré and Valignat on the modeling of the light path in polarized light has led to the development of new supports meeting contrast amplification conditions for optical microscopy between crossed polarizers. Existing anti-reflective surfaces are designed...

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