SEEC microscopy
Surface Enhanced Ellipsomteric Contrast (SEEC) microscopy : optical microscopy as a means of nanoscale characterization
Article REF: NM7500 V1
SEEC microscopy
Surface Enhanced Ellipsomteric Contrast (SEEC) microscopy : optical microscopy as a means of nanoscale characterization

Authors : Nicolas MEDARD, Marie-Pierre VALIGNAT

Publication date: October 10, 2011 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

4. SEEC microscopy

4.1 Principle

In the early 2000s, a study conducted by Ausserré and Valignat on the modeling of the light path in polarized light has led to the development of new supports meeting contrast amplification conditions for optical microscopy between crossed polarizers. Existing anti-reflective surfaces are designed...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?

Article included in this offer

"Optics and photonics"

( 202 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact our team FAQ