Ion beams - Theory and implementation
Quizzed article REF: M4395 V2

Ion beams - Theory and implementation

Author : Erwan OLIVIERO

Publication date: December 10, 2021 | Lire en français

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Overview

ABSTRACT

By producing and accelerating charged particles, it is possible to create ion beams. The mastering of these ion beams and the understanding of their interaction with matter have enabled the development of numerous applications for the synthesis and controlled modification of new materials, but also for the structural and chemical analysis of complex systems. This article first presents the physical phenomena involved in the ion-matter interaction, then explains the implementation of ion beams and finally gives examples of experimental devices.

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AUTHOR

  • Erwan OLIVIERO: Institut Charles Gerhardt Montpellier (ICGM), CNRS, University of Montpellier, France - Editor's note: This article is an updated version of the article entitled "Ion beams. Theory and implementation" written by Franck FORTUNA, Erwan OLIVIERO and Marie-Odile RUAULT and published in 2009.

 INTRODUCTION

Ion beams can be seen as a versatile tool for both the synthesis of new materials and the structural and chemical analysis of complex systems. Their use provides an additional parameter for the experimenter to work through phase diagrams: the system remains fixed (in the manner of a quench) as soon as the beam is cut off.

After a presentation of the physical phenomena involved (stopping power, creation of defects), we'll look at the implementation of ion beams (production, mass sorting, experimental set-ups).

In the following, we will distinguish between two ways of using ion beams: analysis and synthesis. When the ion beam is used for analysis, there are two types of experiment. In the first case, the sample to be studied is the source of ion production, and the analysis consists in mass-sorting the extracted ions. In the second, the analysis results from the interaction of a beam of light ions with the sample, which is then the target. Depending on the nature of the analysis, different types of detectors are used to quantify the energy of the particles scattered by the sample (fluorescence, backscatter, etc.).

When using ion beams as a tool for controlled modification of samples, several parameters (energy, flux, dose, beam type, target temperature) can be adjusted to suit the desired objective (creation of defects, bringing into order, synthesis of new phases or surface modification). We describe the typical experimental setups used to produce the beams (source schematic diagram) and the sample environment, depending on the applications sought (microelectronics, optics, mechanics).

In this article [M 4 386] , we focus on ion beams as a tool for controlling and modifying materials, with or without subsequent analysis. We will present a number of installations that can combine both modes (analysis and controlled modification of materials), giving access to the in situ study of the synthesis of new materials.

Clearly, the implementation and use of ion beams covers a vast field of knowledge. This document aims to provide a basic understanding of ion/matter interaction, as well as an overview of the field through examples, and does not claim to be exhaustive.

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KEYWORDS

Ion beams   |   Ion implantation

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