Brief description of the device
Study of metals by transmission electron microscopy (TEM) - Microscope, samples and diffraction
Article REF: M4134 V1
Brief description of the device
Study of metals by transmission electron microscopy (TEM) - Microscope, samples and diffraction

Authors : Miroslav KARLÍK, Bernard JOUFFREY

Publication date: June 10, 2008 | Lire en français

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1. Brief description of the device

1.1 Transmission electron microscope

The conventional transmission electron microscope (TEM) operates at the usual accelerator voltage of 100 to 300 kV for the study of materials. Higher voltages have been used in the past (up to 3 MV in Toulouse), but it's practically only in Japan that you'll still find equipment operating at 1 to 2 MV.

The TEM gives a global image of a thin object, traversed by fast electrons. The column (figure 1 ) consists of an electron gun, the gas pedal, magnetic lenses (2 or 3) forming the condenser assembly, an objective lens, one or two intermediate lenses, a projection lens (projector) and a chamber for observing and recording...

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