Preparing samples for individual orientation measurements
Texture and anisotropy of polycrystalline materials. Kiluchi diffraction patterns and orientation microscopy
Quizzed article REF: M3040 V2
Preparing samples for individual orientation measurements
Texture and anisotropy of polycrystalline materials. Kiluchi diffraction patterns and orientation microscopy

Authors : Robert SCHWARZER, Claude ESLING

Publication date: November 10, 2024, Review date: January 6, 2023 | Lire en français

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3. Preparing samples for individual orientation measurements

The first requirement for electron microscopy is to have samples that are stable in a vacuum and under the impact of high-energy electrons . They must possess a minimum of electrical conductivity so as not to become charged . In the case of TEM, the electrical charge is less...

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