Glossary
New Requirements of the IEC 61511
Article REF: SE4059 V1
Glossary
New Requirements of the IEC 61511

Author : Olivier IDDIR

Publication date: May 10, 2019, Review date: February 28, 2024 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

5. Glossary

Aussi bon que neuf; as good as new (AGAN)

Calculation assumption used in the standard IEC 61508-6 . After each periodic test, PFD(t) is assumed to return to its initial value.

Danger; hazard

Potential source of damage ( EC 61511 :2016 ).

Risk; risk

Combination of the probability of damage and its severity ( IEC 61511 :2016 ).

Safe failure fraction (SFF)

Proportion of a device's overall rate of random hardware failures that results in a safety failure or a detected unsafe failure (

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Quality manager"

( 214 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact us