4. Analyze your entire patent database
Analyses can be performed on your entire patent database using :
lists (for the record) ;
matrices: data from all available document fields can be cross-referenced: IPCs and applicants (automatic benchmarking), inventors and IPCs (know-how), IPCs and application dates (technological evolution), applicants and application dates (new entrants). However, when the number of records is large, these analyses can be tedious to interpret;
networks: these represent the simple visualization of a correlation, e.g. applicants' networks (which applicants co-publish patents), inventors' networks (potential localized searches, inventors working together), applicants-inventors (potential inventors linked to a company). But here too, interpretation can prove tedious.
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Bibliography
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Bibliography
Dou H., Leveille V., Manullang S. D., Dou J.-M., "Patent Analysis for Competitive Technical Intelligence and Innovative Thinking", Data Science Journal (DSJ), vol. 4, 2005, pp. 209-236
Websites
http://www.ciworldwide.org On ciworldwide.org, see "Archive for the Important papers and books related to CI Category".
http://scholar.google.fr/ Google Scholar
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