Methods for global fitting of the diffractogram
Characterization of polycrystalline materials by X-Ray Diffraction
Article REF: P1080 V3
Methods for global fitting of the diffractogram
Characterization of polycrystalline materials by X-Ray Diffraction

Authors : Sandrine TUSSEAU-NENEZ, Sophie NOWAK

Publication date: April 10, 2026 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

8. Methods for global fitting of the diffractogram

Peak-by-peak methods (§ 7 ) can only be applied to pure phases or to mixtures where there is no overlap of lines, which limits their use. These methods consider only a few peaks in the diffractogram, which can lead to errors. In other cases, a global fit of the diffractogram is required. The basic concepts...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Analysis and Characterization"

( 272 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details
Contact us