Sample preparation
Characterization of polycrystalline materials by X-Ray Diffraction
Article REF: P1080 V3
Sample preparation
Characterization of polycrystalline materials by X-Ray Diffraction

Authors : Sandrine TUSSEAU-NENEZ, Sophie NOWAK

Publication date: April 10, 2026 | Lire en français

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3. Sample preparation

Before moving on to the section on data processing, it is necessary to review the quality of the measurements. In a diffractogram, three parameters are used to describe the diffraction peaks:

  • the position;

  • intensity;

  • the profile of the ridge (width, shape, and asymmetry).

It is therefore important to avoid any errors that could affect these factors, even though it is sometimes possible to make corrections after the measurement using analysis software.

3.1 Criteria to monitor during sample preparation

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