Instrumentation
Charged particle-induced X-ray emission (PIXE): applications
Article REF: P2558 V3
Instrumentation
Charged particle-induced X-ray emission (PIXE): applications

Authors : Philippe MORETTO, Lucile BECK

Publication date: March 10, 2004 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. Instrumentation

Ion beam analysis methods are based on the use of low-energy charged particle gas pedals. These small gas pedals produce light ions ( 1 H + , 2 D + , 3 He + , 4 He + ...) accelerated to energies of between 250 keV and 5 MeV. The interaction between the ions and the target to be analyzed generally takes place in a vacuum analysis chamber, although some devices allow analysis in air. The emitted X-rays are then detected and analyzed according to the principles of conventional X-ray spectrometry [109]...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Analysis and Characterization"

( 256 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details