5. Induced side effects
5.1 Electrically insulating samples
In the case of samples with low electrical conductance, the accumulation of charges brought by the beam, localized on the surface, can lead to discharges towards the conductive support or the walls of the analysis chamber itself. These discharges are sources of X-ray continuum emission, via the violent acceleration/deceleration of secondary electrons in the induced plasma, which is superimposed on the X-ray spectrum. This parasitic background generally appears throughout the spectrum, but becomes the dominant source in the high-energy region, greatly degrading the signal-to-noise ratio in this area. To avoid this problem, it is usually sufficient to connect the surface of the insulating sample to the substrate using a good conductor, thus encouraging...
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Induced side effects
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Processing software
There are around ten PIXE spectrum processing software packages, most of them developed by research laboratories. They are either based on deconvolution with calculation of peak areas, or on fitting a simulated spectrum to the experimental spectrum. They all enable concentrations to be calculated. Seven programs, Geopixe
Conferences
International Conference on Nuclear Microprobe Technology and Applications (ICNMTA), whose proceedings are published every two years.
International Conference on PIXE and its analytical applications, held every 3 years and devoted entirely to the PIXE technique.
International Conference on Ion Beam Analysis, held every 2 years.
European Conference on...
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