Multi-element analysis
Charged particle-induced X-ray emission (PIXE): applications
Article REF: P2558 V3
Multi-element analysis
Charged particle-induced X-ray emission (PIXE): applications

Authors : Philippe MORETTO, Lucile BECK

Publication date: March 10, 2004 | Lire en français

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2. Multi-element analysis

2.1 Choice of analysis conditions

The nature and energy of the particles delivered by the gas pedal will be chosen according to the elements to be analyzed (see article . The ions most often used for PIXE analysis are H + protons, whose ionization cross-section in the few MeV range is, for most elements, greater than that of heavier particles. Ion energies can be selected to analyze as many elements as possible. The K lines of light atoms (11 < Z < 20) can be excited using protons with energies between 1 and 2 MeV, whereas heavier elements (20 < Z < 92) require particles with energies above 2 MeV. The variation in beam energy can also be used to probe different thicknesses of material to obtain a concentration...

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