Principle of the near-field microscope
Local Probe Microscopy
Quizzed article REF: P895 V3
Principle of the near-field microscope
Local Probe Microscopy

Authors : Agnès PIEDNOIR, David ALBERTINI

Publication date: June 10, 2023, Review date: November 19, 2024 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. Principle of the near-field microscope

To appreciate the originality of these new instruments and understand the source of their excellent resolution, we need to briefly review how a traditional microscope works.

In traditional microscopes (optical or electronic), a source of waves (or particles) illuminates an object. The diffracted radiation is then conveyed through optics to the detector (CCD, etc.), which produces a magnified image of the object. The distances between the source and the sample, and between the sample and the detector, are much greater than the wavelength λ of the radiation used.

The smallest distance that can be perceived in the image plane (the inverse of lateral resolution power) is of the order of λ; this theoretical limit is inherent in the phenomenon of radiation propagation through optical magnification systems and, in particular, in the phenomenon...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Ongoing reading
Principle of the near-field microscope

Article included in this offer

"Analysis and Characterization"

( 256 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details