Overview
ABSTRACT
The electron probe X-ray microanalysis allows for analyzing the characteristic spectrum of X rays generated in a target by a finely focused electron beam. Due to this specificity it qualifies for a method of chemical analysis at the micrometer scale. This article presents the theoretical aspects along with the electron-matter interactions as well as the resulting various electronic and electromagnetic emissions. It then details the instrumentation aspect, from the electronic column to the latest semiconductor detector and including the dispersive or selection X-ray spectrometers.
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Jacky RUSTE: INSA engineer, doctor-engineer, senior engineer - EDF Research and Development, Centre des Renardières - Materials and Component Mechanics Department (Moret-sur-Loing)
INTRODUCTION
Electron probe X-ray microanalysis can best be described as a "chemical analysis method on the scale of ". It involves analyzing the characteristic X-ray spectrum generated in a target by a finely focused electron beam.
The idea of using an electron beam to analyze the chemical composition of a sample was born in the 1940s and has been the subject of numerous studies in various countries (V.E. Cosslett in Great Britain, I.B. Borovski in the USSR, J. Hillier in the USA...). At the Delft Congress in 1949, Raimond Castaing (1921-1998) presented the first microprobe, which he built at ONERA under the direction of André Guinier
At present, a distinction can be made between :
on the one hand, the electron probe X-ray microanalyzer, known in France as the "microsonde de Castaing", which uses X-ray spectrometers with monochromator crystals (WDS wavelength-dispersive spectrometers), but also scanning electron imaging;
and, secondly, X-ray microanalysis as an analytical complement to scanning and transmission electron microscopy, using mainly solid-detector X-ray spectrometers (EDS energy-selective spectrometers).
In principle, there is little to distinguish a Castaing electron microprobe from a scanning electron microscope
The present article is devoted to theoretical and instrumental aspects; applications are studied in the
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Electron probe X-ray microanalysis
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