5. Glossary
Cathodoluminescence; Cathodoluminescence
Spectral or imaging analysis of non-conductive samples, such as semiconductors or insulators, often rocks, emitting in the visible range (from IR to UV). A specific detector must be installed in the SEM chamber.
Détecteur BSE ; BSE detector
Detector placed under the objective lens and above the sample. It can be used to highlight chemical, crystallographic or magnetic contrasts.
EBSD detector; Détecteur EBSD
A camera that captures diffraction patterns from the sample as it scans an area. Their point-by-point analysis provides an image of the crystallographic orientation of the sample's grains.
Détecteur EDS ; EDS detector
Recovers the photons emitted during electron-matter interaction,...
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Bibliography
Standards and norms
- Microbeam analysis – scanning electron microscopy - ISO TC202 -
- Terminologie - TC202/SC1 -
- Microanalyse par sonde à électrons - TC202/SC2 -
- Microscopie analytique à électrons - TC202/SC3 -
- Microscopie électronique à balayage - TC202/SC4 -
Directory
Organizations – Federations – Associations (non-exhaustive list)
GNMEBA: Groupement National de Microscopie Électronique à Balayage et microAnalyses, GNMEBA publications available from EDP Sciences, GN-MEBA collection.
Sfmu: Société française des microscopies (more specific to transmission electron microscopy)
SFP: French Physical Society
EMAS:...
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