1. Principle
Observing the micro-relief of a surface is impossible at high magnification with a conventional ("photonic") optical microscope. This is because the separating power (or lateral spatial resolution) is limited to around 0.2 μm and, at maximum magnification of 1,500, the depth of field is limited to around 1 μm. The values of these two parameters depend on the wavelength of the visible radiation, and the beam aperture, and cannot be improved. This is why the idea of forming an image of a sample from :
or a beam of electrons sufficiently accelerated for the associated wavelength to be less than a nanometer: this is transmission electron microscopy (TEM);
or a very fine, almost parallel electron beam, which scans the sample and, from the secondary electrons emitted, forms a point-by-point image: this is scanning...
The Ultimate Scientific and Technical Reference
This article is included in
Analysis and Characterization
This offer includes:
Knowledge Base
Updated and enriched with articles validated by our scientific committees
Services
A set of exclusive tools to complement the resources
Practical Path
Operational and didactic, to guarantee the acquisition of transversal skills
Doc & Quiz
Interactive articles with quizzes, for constructive reading
Principle
A reminder of electron-matter interactions
Bibliography
Standards and norms
- Microbeam analysis – scanning electron microscopy - ISO TC202 -
- Terminologie - TC202/SC1 -
- Microanalyse par sonde à électrons - TC202/SC2 -
- Microscopie analytique à électrons - TC202/SC3 -
- Microscopie électronique à balayage - TC202/SC4 -
Directory
Organizations – Federations – Associations (non-exhaustive list)
GNMEBA: Groupement National de Microscopie Électronique à Balayage et microAnalyses, GNMEBA publications available from EDP Sciences, GN-MEBA collection.
Sfmu: Société française des microscopies (more specific to transmission electron microscopy)
SFP: French Physical Society
EMAS:...
The Ultimate Scientific and Technical Reference
