7. Glossary
Cathodoluminescence; Cathodoluminescence
Spectral or imaging analysis of non-conductive samples, such as semiconductors or insulators, often rocks, emitting in the visible range (from IR to UV). A specific detector must be installed in the SEM chamber.
Détecteur BSE ; BSE detector
Detector placed under the objective lens and above the sample: enables chemical, crystallographic or magnetic contrasts to be highlighted.
EBSD detector; Détecteur EBSD
Camera that captures diffraction patterns from the sample as it scans an area of the sample. Point-by-point analysis provides an image of the crystallographic orientation of the sample grains.
Détecteur EDS ; EDS detector
Recovers photons emitted during electron-matter interaction,...
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Glossary
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Bibliography
Standards and norms
- Microbeam analysis – scanning electron microscopy: - ISO TC202 -
TC202/SC1: terminology
TC202/SC2: electron probe microanalysis
TC202/SC3: analytical electron microscopy
TC202/SC4: scanning electron microscopy.
Directory
Organizations – Federations – Association (non-exhaustive list)
GNMEBA: Groupement National de Microscopie Électronique à Balayage et microAnalyses, available from EDP Sciences, GN-MEBA collection.
Sfmu: Société française des microscopies (more specific to transmission electron microscopy)
SFP: French Physical Society
EMAS: European Microbeam...
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