Sample preparation
Scanning electron microscopy -Images, applications and developments
Article REF: P866 V3
Sample preparation
Scanning electron microscopy -Images, applications and developments

Authors : François Brisset, Jacky Ruste

Publication date: October 10, 2024 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

3. Sample preparation

3.1 Metallic materials

The current metal sample is solid, a very good electrical and thermal conductor, and non-volatile. It is therefore easy to observe significant micro-relief on these materials:

  • breaks ;

  • machined or corroded surfaces ;

  • surface deposits ;

  • of polished and etched sections in much the same way as in optical metallography, the etching creating a significant micro-relief of the microstructure through preferential dissolution of the various phases and/or accentuated dissolution at the interfaces (grain boundaries and phase boundaries);

  • of unetched polished sections (in backscattered or absorbed...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Analysis and Characterization"

( 256 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details