Recording diffraction intensities
X-ray crystal structure resolution
Article REF: P1075 V2
Recording diffraction intensities
X-ray crystal structure resolution

Author : Yves JEANNIN

Publication date: December 10, 1998 | Lire en français

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1. Recording diffraction intensities

1.1 Choice of crystal

Any structure resolution requires a crystal. The quality of the crystal determines the quality of the result, i.e. the accuracy of interatomic distances and bond angles. The best way to ensure that the chosen crystal is single-crystal is to examine it first under the microscope. The faces must be clear; the presence of re-entrant angles is the manifestation of a macle, which prompts rejection of the crystal (see article [25] ). If you have crystals in clusters, you can try to separate one of them using a razor blade or a sharp glass rod. The latter is sometimes very convenient, as static electricity is sufficient to hold the selected crystal in place. A more complete and precise examination is performed...

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