X-ray diffraction characterization of crystallized solids
Article REF: P1080 V2

X-ray diffraction characterization of crystallized solids

Author : Norbert BROLL

Publication date: April 10, 1996 | Lire en français

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AUTHOR

  • Norbert BROLL: Doctor of Science - Director of FORTEX's materials analysis laboratory - Lecturer and researcher at the École Nationale Supérieure des Arts et Industries de Strasbourg

 INTRODUCTION

Non-destructive X-ray diffraction analysis of crystallized samples is a powerful method for solving many industrial and technological problems. Initially, this technique was mainly used to determine crystal structures from single-crystal samples. Subsequently, other applications involving the characterization of polycrystalline materials were developed.

Among the instruments currently in use, the powder diffractometer is certainly the most common in industrial and university laboratories.

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X-ray diffraction characterization of crystallized solids

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