1. Atomic force microscopy for measuring specific interactions
1.1 Principle of AFM and its main applications
AFM technology, introduced in 1986 , works by controlling the force exerted between a fine tip and a surface while scanning a sample. It relies on physical surface scanning, which distinguishes it from electron and optical microscopy. During scanning, the tip follows the relief of the sample, inducing a deflection of the lever to which it is attached. This deflection is detected by a laser reflected off the back of the lever...
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Atomic force microscopy for measuring specific interactions
Functionalization of AFM levers and tips with inert particles
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"Mechanical and dimensional measurements"
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