Article | REF: R6743 V1

Reference materials for nanometrology - Current situation

Author: Nicolas FELTIN

Publication date: September 10, 2025 | Lire en français

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!

Automatically translated using artificial intelligence technology (Note that only the original version is binding) > find out more.

    A  |  A

    Overview

    ABSTRACT

    The continued development of nanotechnologies and nanomaterials requires reliable and comparable measurement results, so that robust quality control can be put in place to improve industrial production processes, meet regulatory requirements and ensure the safety of nanoproducts on the market.

    Nanometrology, the science of measurement on the nanoscale, therefore has a central role to play. Progress in this field will only be possible when the supply of reference nanomaterials and nanostructures is expanded.

    This article reviews the reference materials available on the nanometric scale, and also describes the needs in two priority fields: the nano-object industry (e.g. nanoparticles) and nano-electronics. Numerous quantities are concerned, but the needs are primarily concentrated on dimensional metrology.

    After an introduction to definitions and the importance of reference materials in metrology, we examine the issues and difficulties involved in measuring the size of nano-objects and nanostructures.

    Read this article from a comprehensive knowledge base, updated and supplemented with articles reviewed by scientific committees.

    Read the article

    AUTHOR

    • Nicolas FELTIN: Head of Materials Department - Laboratoire National de Métrologie et d'Essais (LNE), Trappes, France

     INTRODUCTION

    The continuing interest in nanomaterials, and the vast range of applications that can be expected from them, can be explained by the strong dependence of the physicochemical properties of objects, whose dimensions range from 1 to 100 nm, on their dimensional characteristics (size and morphology). So, for each desired functional property (electronic, magnetic, optical, thermodynamic, mechanical, etc.) associated with a particular application (all sectors of activity are concerned), it is possible to design a specific nanomaterial. All those involved in this field agree that the development of metrology and instrumentation adapted to the nanometric domain (1 nm–100 nm) would have a "catalytic" effect on the overall development of nanotechnologies.

    The entire value chain linked to the production and use of nanomaterials and nanotechnologies is concerned by measurement, from fundamental research to production lines, via the teams involved in studying the impact of these materials on health and the environment. The entire industry needs reliable data, robust and reproducible characterization methods, and confidence in measurement results.

    Firstly, measurement plays a crucial role in fundamental research, enabling us to increase our knowledge of nanomaterial properties in order to better understand the correlation between the physicochemical parameters of nano-objects, on the one hand, and the new physical properties that emerge at these nanometric scales, on the other. Secondly, the manufacturers of these nanomaterials are looking for precise tools to better control their manufacturing processes and improve their quality systems. In addition, the transition from laboratory to industrial scale (scale-up) remains a delicate stage in the development of nanomaterials, as synthesis methods are often specific and particular. What's more, it's vital to maintain the precise characteristics of nano-objects developed in the laboratory, so as to preserve their properties at all stages of industrialization. This requires the implementation of measurement methods capable of providing accurate measurements, i.e. measurements that are both precise and faithful (see § 3 ).

    Numerous industrial products containing nanomaterials are already on the market,...

    You do not have access to this resource.

    Exclusive to subscribers. 97% yet to be discovered!

    You do not have access to this resource.
    Click here to request your free trial access!

    Already subscribed? Log in!


    The Ultimate Scientific and Technical Reference

    A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
    + More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
    From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

    KEYWORDS

    thin film   |   metrological traceability   |   calibration   |   nanoparticule   |   Nanometrology   |   certified reference materials   |   ISO/REMCO   |   critical dimensions


    This article is included in

    Mechanical and dimensional measurements

    This offer includes:

    Knowledge Base

    Updated and enriched with articles validated by our scientific committees

    Services

    A set of exclusive tools to complement the resources

    Practical Path

    Operational and didactic, to guarantee the acquisition of transversal skills

    Doc & Quiz

    Interactive articles with quizzes, for constructive reading

    Subscribe now!

    Ongoing reading
    Reference materials for nanometrology