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Article | REF: R1084 V1

Measurement techniques for electrical quantities adapted to nanocircuits

Authors: Brice GAUTIER, Pascal CHRÉTIEN, Khalifa AGUIR, Frédéric HOUZÉ, Olivier SCHNEEGANS, Johannes HOFFMANN, Nicolas CHEVALIER, Łukasz BOROWIK, Dominique DERESMES, Pierre GOURNAY, Philippe MAILLOT, François PIQUEMAL

Publication date: December 10, 2016 | Lire en français

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    1. Current measurement

    1.1 Introduction

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    1.1.1 Issues

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    1.1.1.1 MOS structure and dielectric breakdown

    Measuring the transport properties of nano-objects (nanocrystals, nanowires, extremely thin films, etc.) is of crucial importance both in fundamental physics, for understanding...

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