1. Reminders: Random Functions and Linear Filtering

Figure 1 - Trajectory of an electron in a semiconductor bar in the presence of an electric field

Figure 2 - Instantaneous current associated with electron transfer

Figure 3 -

Figure 4 - Variation in the spectral density of the shot stream i D as a function of

Figure 5 - Variation in the spectral density of the thermal noise current generator in parallel with the admittance Y &#61; G &#43; jB, as a function of the conductance G, at different temperatures

Figure 6 - Relative variation in current associated with an RTS process

Figure 7 - Spectral density of current fluctuation as a function of frequency

Figure 8 - Variation of the P plateau (in A2/Hz) as a function of  (in s) for  and

Figure 9 - Representations of dipole noise

Figure 10 - Standard deviation Id d of the shot noise current as a function of the average current ID, for different values of the band B measured in hertz

Figure 11 - Standard deviation E d d of the thermal noise voltage generator across a resistor R, at T &#61; 300 K, for different values of the bandwidth B measured in hertz

Figure 12 - Standard deviation Id of the thermal noise current generator across a resistor R, at T &#61; 300 K, for different values of the frequency band B measured in hertz

Figure 13 - Equivalent diagram of the parallel RC circuit and representation of noise

Figure 14 - Dipole combinations

Figure 15 - Representation of a T-quadrupole by two noise sources

Figure 16 - Representation of quadrupole noise by two sources reduced to the input

Figure 17 - Variation of F–1 with source resistance R for three pairs of values (e n, i n)

Figure 18 - Cascaded quadripole chain