Background noise and measurements - Theoretical aspects
Article REF: R310 V1

Background noise and measurements - Theoretical aspects

Authors : Matteo VALENZA, Fabien PASCAL, Alain HOFFMANN

Publication date: December 10, 2006 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

Overview

Read this article from a comprehensive knowledge base, updated and supplemented with articles reviewed by scientific committees.

Read the article

AUTHORS

 INTRODUCTION

Note:

(This is a revision of file R 310 written by Michel SAVELLI, José COMALLONGA, and Laurent BOGGIANO.)

The performance of electronic systems is increasingly limited by the noise behavior of both passive and active components. It is important for designers to have as accurate an assessment as possible of component background noise and to be familiar with existing measurement techniques and simulation models.

We have therefore focused this report and the next one  on four main objectives.

The first objective addressed in this report is to quickly clarify the mathematical formalism and, from a theoretical point of view, the physical origin of the main sources of background noise, as well as how these sources are characterized within the framework of circuit theory.

The other three objectives will be developed in the dossier.  .

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Ongoing reading
Background noise and measurements

Article included in this offer

"Electronic measurements and tests"

( 79 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details