Overview
Read this article from a comprehensive knowledge base, updated and supplemented with articles reviewed by scientific committees.
Read the articleAUTHORS
-
Matteo VALENZA: Professor at Montpellier II University
-
Fabien PASCAL: Professor at Montpellier II University
-
Alain HOFFMANN: Professor at Montpellier II University
INTRODUCTION
(This is a revision of file R 310 written by Michel SAVELLI, José COMALLONGA, and Laurent BOGGIANO.)
The performance of electronic systems is increasingly limited by the noise behavior of both passive and active components. It is important for designers to have as accurate an assessment as possible of component background noise and to be familiar with existing measurement techniques and simulation models.
We have therefore focused this report and the next one on four main objectives.
The first objective addressed in this report is to quickly clarify the mathematical formalism and, from a theoretical point of view, the physical origin of the main sources of background noise, as well as how these sources are characterized within the framework of circuit theory.
The other three objectives will be developed in the dossier. .
Exclusive to subscribers. 97% yet to be discovered!
Already subscribed? Log in!
Background noise and measurements
Article included in this offer
"Electronic measurements and tests"
(
79 articles
)
Updated and enriched with articles validated by our scientific committees
A set of exclusive tools to complement the resources