Noise measurements
Measuring electronic components - Part 1: Methods and precautions

Article REF: R1078 V1

Noise measurements
Measuring electronic components - Part 1: Methods and precautions

Authors : Patrick POULICHET, Gilles AMENDOLA, Christophe DELABIE, Yves BLANCHARD

Publication date: December 10, 2008 | Lire en français

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3. Noise measurements

3.1 Power, power spectral density, noise figure

3.1.1 Reminder of the main quantities to be measured

The reduced power, which is the noise power in a 1 Ω resistor, is the root mean square value of the noise voltage :

{\bar{V_{b} (t)}}^{2} = lim_{T \to \infty} [\frac{1}{T}

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References

(1) - Agilent - Fundamentals of Microwave Frequency Counters. - Argilent Technologies, USA (1997). Disponible sur Internet http://cp.literature.agilent.com/litweb/pdf/5965-7661E.pdf .
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