Article | REF: R1079 V1

Measuring electronic components - Part 2: Measurement of passive components

Authors: Patrick POULICHET, Gilles AMENDOLA, Christophe DELABIE, Yves BLANCHARD

Publication date: December 10, 2008 | Lire en français

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    AUTHORS

    • Patrick POULICHET: ESIEE

    • Gilles AMENDOLA: ESIEE

    • Christophe DELABIE: ESIEE

    • Yves BLANCHARD: ESIEE

     INTRODUCTION

    This report follows on from [R 1 078v2] and deals with measurements on passive components.

    Most of the electrical characteristics of electronic components depend on the frequency at which they are measured. This dependence is linked to the existence of parasitic elements such as inductance or capacitance.

    As we saw in Measuring electronic components. Part 1 [R 1 078v2] , many of these measurements can be made with a device capable of measuring impedance: automatic bridge, I-V or RF I-V measurement and network analyzer. Using a model chosen by the user, these devices can determine the resistance, capacitance and inductance values best suited to the measurement.

    This text is the new edition of the article Mesure des composants électroniques, written in 1993 by Jean-Claude GOURDON and Paul PRODHOMME, from which some extracts are taken.

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