3. Other contact microscopies
3.1 Lateral force microscope (LFM)
For low-fragility materials, Lateral Force Microscopy (LFM) can be used to visualize areas of differing friction coefficients on the surface of heterogeneous materials
As the sample is scanned, the spring undergoes torsion in addition to vertical deflection. The deflection of the spring causes a vertical displacement of the laser beam reflected by the mirror (figure
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Other contact microscopies
Microscopy in non-contact (or resonant) mode
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