Description of the AFM-IR technique
AFM-IR : a tool to explore the matter at the nanoscale
Research and innovation REF: IN224 V1
Description of the AFM-IR technique
AFM-IR : a tool to explore the matter at the nanoscale

Authors : Alexandre DAZZI, Ariane DENISET-BESSEAU

Publication date: July 10, 2019 | Lire en français

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2. Description of the AFM-IR technique

2.1 Local absorption measurement

The AFM-IR technique (figure 1 ) involves illuminating a sample with a wavelength-tunable IR laser source while probing it with the tip of an atomic force microscope (patent US 2008/0283,755). If this laser source is tuned to a wavelength corresponding to one of the sample's absorption bands, a photothermal effect is generated. The AFM tip is then used as a detector of this absorption.

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Description of the AFM-IR technique

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