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Research and innovation | REF: IN224 V1

AFM-IR : a tool to explore the matter at the nanoscale

Authors: Alexandre DAZZI, Ariane DENISET-BESSEAU

Publication date: July 10, 2019 | Lire en français

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    2. Description of the AFM-IR technique

    2.1 Local absorption measurement

    The AFM-IR technique (figure 1 ) involves illuminating a sample with a wavelength-tunable IR laser source while probing it with the tip of an atomic force microscope (patent US 2008/0283,755). If this laser source is tuned to a wavelength corresponding to one of the sample's absorption bands, a photothermal effect is generated. The AFM tip is then used as a detector of this absorption.

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