Experimentation and testing of digital negative time circuits
Two-order IIR NGD circuit design on STM32 microcontroller
Research and innovation REF: IN408 V1
Experimentation and testing of digital negative time circuits
Two-order IIR NGD circuit design on STM32 microcontroller

Authors : Blaise RAVELO, Mathieu GUÉRIN, Wenceslas RAHAJANDRAIBE, Lala RAJAOARISOA

Publication date: June 10, 2023 | Lire en français

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5. Experimentation and testing of digital negative time circuits

Experiments and validation tests have been carried out on our digital PB CTN. These tests are based on the use of the STM32® microcontroller manufactured by STMicroelectronics®. The results of our practical study are described in this section.

5.1 Prototyping a digital negative time circuit

The Nucleo L476RG board integrating the STM32L476RG MCU manufactured by STMicroelectronics® was used for this practical study. . The MCU package is a 64-pin IC. Figure

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