Thermomechanical lifetime models
Thermomechanical durability of lead-free electronic assemblies
Article REF: E3956 V1
Thermomechanical lifetime models
Thermomechanical durability of lead-free electronic assemblies

Author : Jean-Baptiste LIBOT

Publication date: February 10, 2026 | Lire en français

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5. Thermomechanical lifetime models

5.1 Statistical analysis of lifetime data using the two-parameter Weibull distribution

Accelerated thermal cycling tests are used to measure the number of cycles to failure for different types of electronic assemblies. A large number of identical configurations (i.e., same component, same PCB, same solder, and same thermal cycling conditions) must be tested in order to perform statistical post-processing of the experimental results in terms of thermomechanical lifetime. The IPC-9701 standard, for example, recommends a sample size of 32. 

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