Heterojunction field-effect transistors on GaAs and InP
III-V heterostructure-based transistors and integrated circuits
Article REF: E2450 V2
Heterojunction field-effect transistors on GaAs and InP
III-V heterostructure-based transistors and integrated circuits

Authors : André SCAVENNEC, Sylvain DELAGE

Publication date: November 10, 2011, Review date: June 3, 2015 | Lire en français

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2. Heterojunction field-effect transistors on GaAs and InP

The use of a heterojunction between high-gap (N-doped) and low-gap (undoped) materials is the basis for the operation of heterojunction field-effect transistors. The principle of such a heterojunction was proposed by Bell Laboratories in the late 1970s. Its interest is illustrated below in the particular case of the GaAlAs (N)/GaAs (n.d.) HEMT transistor, which appeared in the early 1980s, with an initial demonstration by Thomson-CSF's Laboratoire Central de Recherche, now Thales Research and Technology – Fr

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