General presentation
Study of metals by transmission electron microscopy (TEM)
Article REF: M4135 V1
General presentation
Study of metals by transmission electron microscopy (TEM)

Authors : Miroslav KARLÍk, Bernard JOUFFREY

Publication date: September 10, 2008 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. General presentation

The interaction of the electrons with the material results in a non-uniform distribution of beam intensity on the exit face of the thin plate. In general, however, this non-uniformity does not result in an image with sufficient contrast. To obtain usable images, it is only necessary to select part of the electron beam using a diaphragm. Contrast is therefore created by the operator's manipulations (orientation, sample thickness, centering of the device, beam aperture, diaphragms used...) and depends on the operating process. To take full advantage of the possibilities offered by the instrument, it is essential to have a good knowledge of the details of the origin of contrasts [1][2][3]...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Studies and properties of metals"

( 160 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details