Phase contrast
Study of metals by transmission electron microscopy (TEM)
Article REF: M4135 V1
Phase contrast
Study of metals by transmission electron microscopy (TEM)

Authors : Miroslav KARLÍk, Bernard JOUFFREY

Publication date: September 10, 2008 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

5. Phase contrast

Interference effects (phase effects) form the basis of atomic resolution imaging and electron holography. A large contrast diaphragm is used, allowing several beams to pass through (figure 1 b), and the image results from their interference. The diffracted waves are π/2 out of phase with the incident wave. However, by defocusing the lens (underfocusing, i.e. focusing above the object by a precise amount), an additional phase shift of π/2 with respect to the transmitted beam is introduced into the diffracted beams, which will compensate for the phase shift due to sphericity aberration. It is at this defocus, known as...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Article included in this offer

"Studies and properties of metals"

( 160 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details