Practical sheet | REF: FIC1500 V1

Understanding the Bayesian approach to metrology

Author: Stéphane PUYDARRIEUX

Publication date: June 10, 2015 | Lire en français

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2. Measurement dispersion and the emergence of the concept of uncertainty

With all the measurement systems at your disposal, if you repeat the measurements, you'll get the following answers instead.

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Measurement dispersion and the emergence of the concept of uncertainty