Mistakes to avoid
Understanding the Bayesian approach to metrology
Practical sheet REF: FIC1500 V1
Mistakes to avoid
Understanding the Bayesian approach to metrology

Author : Stéphane PUYDARRIEUX

Publication date: June 10, 2015 | Lire en français

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6. Mistakes to avoid

6.1 Don't contrast frequentist and Bayesian approaches

The two approaches are inseparable, like two sides of the same coin!

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6.2 Don't look for Bayesian everywhere

After the initial successes, it would be a mistake to see Bayesian everywhere, or to want to do everything in Bayesian.

The Bayesian approach is in fact a tool available to the metrologist to improve knowledge of true values. Like any tool, it is not always possible to use it.

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