The measurement process and measurement dispersion
Understanding the Bayesian approach to metrology
Practical sheet REF: FIC1500 V1
The measurement process and measurement dispersion
Understanding the Bayesian approach to metrology

Author : Stéphane PUYDARRIEUX

Publication date: June 10, 2015 | Lire en français

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1. The measurement process and measurement dispersion

In this form, we represent the measurement process by distinguishing two spaces: the space of true values (reality) and the space of measurement values (the response of the measurement system).

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