1. Home
  2. Measurements - Analysis
  3. Laboratory quality and safety procedures
  4. Understanding the Bayesian approach to metrology

  5. The measurement process and measurement dispersion

Practical sheet | REF: FIC1500 V1

Understanding the Bayesian approach to metrology

Author: Stéphane PUYDARRIEUX

Publication date: June 10, 2015 | Lire en français

You do not have access to this resource.
Click here to request your free trial access!

Already subscribed? Log in!

Automatically translated using artificial intelligence technology (Note that only the original version is binding) > find out more.

    A  |  A

    1. The measurement process and measurement dispersion

    In this form, we represent the measurement process by distinguishing two spaces: the space of true values (reality) and the space of measurement values (the response of the measurement system).

    You do not have access to this resource.

    Exclusive to subscribers. 97% yet to be discovered!

    You do not have access to this resource.
    Click here to request your free trial access!

    Already subscribed? Log in!

    The Ultimate Scientific and Technical Reference

    A Comprehensive Knowledge Base, with over 1,200 authors and 100 scientific advisors
    + More than 10,000 articles and 1,000 how-to sheets, over 800 new or updated articles every year
    From design to prototyping, right through to industrialization, the reference for securing the development of your industrial projects

    This article is included in

    Laboratory quality and safety procedures

    This offer includes:

    Knowledge Base

    Updated and enriched with articles validated by our scientific committees

    Services

    A set of exclusive tools to complement the resources

    Practical Path

    Operational and didactic, to guarantee the acquisition of transversal skills

    Doc & Quiz

    Interactive articles with quizzes, for constructive reading

    Subscribe now!

    Ongoing reading
    The measurement process and measurement dispersion
    Outline