General information on the methods approach
Microanalysis of surfaces and thin films
Article REF: P3795 V2
General information on the methods approach
Microanalysis of surfaces and thin films

Author : Guy BLAISE

Publication date: October 10, 1990, Review date: January 5, 2014 | Lire en français

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1. General information on the methods approach

1.1 Element detectability

An element appears detectable as soon as the physical process on which the analysis method is based is compatible with the electronic and nuclear constitution of the element in question. To be more precise, however, elements need to be placed on a detectability scale. This is what we'll be attempting to do, based on a very stripped-down physical analysis of the elementary physical processes involved. Detectability should not be confused with the detection limit, which takes into account all physical and instrumental parameters.

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