Microanalysis based on photon irradiation
Microanalysis of surfaces and thin films
Article REF: P3795 V2
Microanalysis based on photon irradiation
Microanalysis of surfaces and thin films

Author : Guy BLAISE

Publication date: October 10, 1990, Review date: January 5, 2014 | Lire en français

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4. Microanalysis based on photon irradiation

A description of the physical principles involved and the methods of analysis can be found in the following articles of this treatise:

  • X-ray characterization of surfaces and laminated materials ;

  • Synchroton radiation and applications ;

  • Raman spectrometry ;

  • Surface analysis by ESCA. Principle and instrumentation [P 2 625] .

4.1 Theoretical considerations

Absorption or secondary emission spectrometry based on UV or X-ray photon irradiation are all based on the inelastic...

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