Different experimental configurations
Near-field optical microscopy

Add to my library

P862 V1 Article

Different experimental configurations


Near-field optical microscopy

Author : Daniel VAN LABEKE

Publication date: March 10, 1998 | Lire en français

Add to my library Add to my library

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

1. Different experimental configurations

In scanning tunneling electron microscopy, there is only one configuration. On the other hand, in near-field optical microscopy, numerous experimental configurations have been proposed and developed. Here, we present the main configurations to date.

First of all, as with traditional optical microscopy, a distinction must be made between microscopes that work by transmission and those that work by reflection. In transmission, light passes through the object, requiring transparent or sufficiently thin objects. Many potential applications involve non-transparent objects, and will require a reflection microscope.

But the specificity of near-field microscopes lies in the way the probe is used. There are three modes of operation: illumination, collection and perturbation.

In illumination mode, the probe is used as a nanosource...

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Ongoing reading
Different experimental configurations

Article included in this offer

"Analysis and Characterization"

( 271 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details

Contenus associés

Sur le même sujet

Veille personnalisée : Inscrivez-vous !

Dans les ressources documentaires

Microscopie électronique à balayage - Principe et équipement

La microscopie électronique à balayage MEB, est une technique puissante d'observation de la sur...

Microscopie électronique à balayage - Images, applications et développements

La microscopie électronique à balayage est un outil puissant d'observation des surfaces. Les im...

Microscopie à sonde locale

Cet article traite de la microscopie en champ proche ou à sonde locale. Ce type de microscopie est basé s...

Microscopie acoustique

La microscopie acoustique regroupe plusieurs modalités d’imagerie acoustique qui poursuivent le même but&...

Tous les livres blancs
Toutes les actualités
Contact us