Crystallographic applications
X-ray diffraction characterization of crystallized solids
Article REF: P1080 V2
Crystallographic applications
X-ray diffraction characterization of crystallized solids

Author : Norbert BROLL

Publication date: April 10, 1996 | Lire en français

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5. Crystallographic applications

The diffractogram of a polycrystalline material makes it possible to determine the parameters of the elemental lattice, often with very high precision. Structural analysis, on the other hand, is difficult to access, although significant progress has been made in recent years.

5.1 Indexing powder diagrams

The positions of the lines in a diffractogram are determined from the dimensions of the elementary crystal lattice. Conversely, knowledge of the crystal lattice is available by examining the powder diagram. In the first phase, for each reflection, the indices ( h, k, œ ) of the corresponding family of planes are determined from the reciprocal lattice.

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