Principles of X-ray emission spectrometry

X-ray emission spectrometry. X-ray fluorescence

Figure 1 - Wavelengths and energies of the Kα1, Lα1 and Mα emission lines, as well as the K, L1 and M3 absorption discontinuities, for the various elements as a function of their atomic number Z

Figure 3 - Comparison of spectral distribution curves for tungsten, molybdenum and chromium anticathodes (45 kV) (from [11])

Figure 4 - Variation of the mass absorption coefficient µ/ ρ of molybdenum as a function of wavelength λ

Figure 5 - Variation of fluorescence yield ω as a function of element atomic number Z

Figure 6 - Variation of the relative intensity R of a fluorescence line X of an element as a function of its concentration C in a neutral matrix

Figure 7 - Construction of a sequential wavelength-dispersive X-ray fluorescence spectrometer

Figure 8 - Principle of a simultaneous wavelength-dispersive X-ray fluorescence spectrometer; only two channels shown

Figure 9 - Construction of an energy-selective X-ray fluorescence spectrometer

Figure 10 - Energy dispersive spectrometer: excitation by an X-ray tube (after [10])

Figure 11 - Energy dispersive spectrometer: excitation by a radioactive source (from [10])

Figure 12 - Principle of the total reflection X-ray fluorescence spectrometer (from Seifert document)

Figure 13 - X-ray transmission through balanced filters (which can frame, for example, the Kα doublet of zinc) (from [10])

Figure 15 - TXRF detection limits for various elements in residues from aqueous solutions

Figure 16 - Diagram of a GXERF spectrometer [64]

Figure 17 - Schematic of an analytical X-ray microscope with details of the paraboloid guide (Oxford Instruments document).