Comparison with other techniques
Ellipsometry - Instrumentation and applications
Article REF: R6491 V1
Comparison with other techniques
Ellipsometry - Instrumentation and applications

Authors : Frank BERNOUX, Jean-Philippe PIEL, Bernard CASTELLON, Christophe DEFRANOUX, Jean-Hervé LECAT, Pierre BOHER, Jean-Louis STEHLÉ

Publication date: June 10, 2003 | Lire en français

Logo Techniques de l'Ingenieur You do not have access to this resource.
Request your free trial access! Free trial

Already subscribed?

4. Comparison with other techniques

Numerous surface analysis techniques are commercially available. Here we give examples of different applications and, for each application, the most commonly used techniques (table 1 gives the performance of these methods).

4.1 Surface characterization

The techniques considered here do not provide information about the depth of the material, but allow the surface appearance of a sample to be visualized at different scales [22] .

  • Stylus measurement

    The tip of a stylus is in contact with the surface and, as it moves horizontally, follows variations in the surface level....

You do not have access to this resource.
Logo Techniques de l'Ingenieur

Exclusive to subscribers. 97% yet to be discovered!

You do not have access to this resource. Click here to request your free trial access!

Already subscribed?


Ongoing reading
Comparison with other techniques

Article included in this offer

"Mechanical and dimensional measurements"

( 121 articles )

Complete knowledge base

Updated and enriched with articles validated by our scientific committees

Services

A set of exclusive tools to complement the resources

View offer details