Current measurement
Measurement techniques for electrical quantities adapted to nanocircuits

Article REF: R1084 V1

Current measurement
Measurement techniques for electrical quantities adapted to nanocircuits

Authors : Brice GAUTIER, Pascal CHRÉTIEN, Khalifa AGUIR, Frédéric HOUZÉ, Olivier SCHNEEGANS, Johannes HOFFMANN, Nicolas CHEVALIER, Łukasz BOROWIK, Dominique DERESMES, Pierre GOURNAY, Philippe MAILLOT, François PIQUEMAL

Publication date: December 10, 2016 | Lire en français

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1. Current measurement

1.1 Introduction

1.1.1.1 MOS structure and dielectric breakdown

Measuring the transport properties of nano-objects (nanocrystals, nanowires, extremely thin films, etc.) is of crucial importance both in fundamental physics, for understanding...

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Bibliography

(1) - FOISSAC (R.), BLONKOVSKI (S.), KOGELSCHATZ (M.), DELCROIX (P.) - . – J. Appl. Phys. 116, 024505 (2014).
(2) - WASER (R.), DITTMANN (R.), STAIKOV (G.), SZOT (K.) - . – Adv. Mater., vol. 21, (25-26), pp. 2632-2663 (2009).

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