3. Electrostatic force measurements
3.1 Electrostatic force microscopy (EFM)
Electrostatic Force Microscopy (EFM) is a technique derived from
resonant-mode AFM that visualizes the distribution of electrical potential
induced by the presence of charges and/or dipoles on the surface of
a sample. The technique is based on the detection of the electrostatic
force, a long-range force (> 100 nm), which exists between a conductive
tip and a sample in the presence of a non-zero potential difference.
The first electrostatic force detection test was carried out in 1988
by Martin and colleagues.
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