Metrological performance of devices
Nanoelectronics for ampere metrology
Article REF: R1085 V3
Metrological performance of devices
Nanoelectronics for ampere metrology

Authors : Nicolas FELTIN, Xavier JEHL

Publication date: December 10, 2011 | Lire en français

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3. Metrological performance of devices

The metrological properties of electron pumps have been intensively studied, but their development ceased several years ago, as it was impossible to expect a significant increase in current intensity. Hope therefore crystallized on non-adiabatic nanodevices. The first non-adiabatic pumping experiments were carried out simultaneously on different semiconductor systems, namely in AlGaAs/GaAs heterostructures and silicon nanowires. The results obtained with these devices and recent developments are presented in paragraphs 3.2 and ...

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