Conclusion
Polymer surface imaging: atomic force microscopy
Article REF: AM3280 V1
Conclusion
Polymer surface imaging: atomic force microscopy

Author : Ghislaine COULON

Publication date: January 10, 2000 | Lire en français

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6. Conclusion

Atomic force microscopy is a rapidly evolving technique. This presentation focused on imaging polymer surfaces. It should be noted, however, that this technique is also widely used in nanotribology and nanomechanics. While the advent of the intermittent mode has made it possible to significantly increase the resolution of polymer surface images, the interpretation of image contrast is far from being totally resolved. At present, many teams are studying tip-surface interactions and trying to establish the experimental conditions that lead either to a topographic-type image, or to a mechanical-type image. Atomic force microscopy is also used to study the surface topography of other materials such as ceramics, semiconductors, metals... However, when materials oxidize easily in air, it is necessary to place the microscope in a controlled atmosphere or vacuum; these conditions are essential if...

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